OZDEMIR, O. Et Al. 2006. Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure. THIN SOLID FILMS , vol.497 , 149-156.

OZDEMIR, O., ATILGAN, İ., AKAOGLU, B., Sel, K., & KATIRCIOGLU, B., (2006). Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure. THIN SOLID FILMS , vol.497, 149-156.

OZDEMIR, ÖZTÜRK Et Al. "Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure," THIN SOLID FILMS , vol.497, 149-156, 2006

OZDEMIR, ÖZTÜRK Et Al. "Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure." THIN SOLID FILMS , vol.497, pp.149-156, 2006

OZDEMIR, O. Et Al. (2006) . "Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure." THIN SOLID FILMS , vol.497, pp.149-156.

@article{article, author={ÖZTÜRK ÖZDEMİR Et Al. }, title={Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure}, journal={THIN SOLID FILMS}, year=2006, pages={149-156} }