E. COŞKUN Et Al. , "TEMPERATURE DEPENDENT CHARACTERIZATION OF SnS/Si NANOWIRE DEVICE APPLICATION," Turk Fizik Derneği 36 sempozyum , İstanbul, Turkey, pp.78, 2020
COŞKUN, E. Et Al. 2020. TEMPERATURE DEPENDENT CHARACTERIZATION OF SnS/Si NANOWIRE DEVICE APPLICATION. Turk Fizik Derneği 36 sempozyum , (İstanbul, Turkey), 78.
COŞKUN, E., GÜLLÜ, H. H., EMİR, C., & PARLAK, M., (2020). TEMPERATURE DEPENDENT CHARACTERIZATION OF SnS/Si NANOWIRE DEVICE APPLICATION . Turk Fizik Derneği 36 sempozyum (pp.78). İstanbul, Turkey
COŞKUN, EMRE Et Al. "TEMPERATURE DEPENDENT CHARACTERIZATION OF SnS/Si NANOWIRE DEVICE APPLICATION," Turk Fizik Derneği 36 sempozyum, İstanbul, Turkey, 2020
COŞKUN, EMRE Et Al. "TEMPERATURE DEPENDENT CHARACTERIZATION OF SnS/Si NANOWIRE DEVICE APPLICATION." Turk Fizik Derneği 36 sempozyum , İstanbul, Turkey, pp.78, 2020
COŞKUN, E. Et Al. (2020) . "TEMPERATURE DEPENDENT CHARACTERIZATION OF SnS/Si NANOWIRE DEVICE APPLICATION." Turk Fizik Derneği 36 sempozyum , İstanbul, Turkey, p.78.
@conferencepaper{conferencepaper, author={EMRE COŞKUN Et Al. }, title={TEMPERATURE DEPENDENT CHARACTERIZATION OF SnS/Si NANOWIRE DEVICE APPLICATION}, congress name={Turk Fizik Derneği 36 sempozyum}, city={İstanbul}, country={Turkey}, year={2020}, pages={78} }