İ. KAVDIR And D. Guyer, "Artificial neural networks machine vision and surface reflectance spectra for apple defect detection," ASAE Annual International Meeting, Milwaukee, WI July 2000 , 2000
KAVDIR, İ. And Guyer, D. 2000. Artificial neural networks machine vision and surface reflectance spectra for apple defect detection. ASAE Annual International Meeting, Milwaukee, WI July 2000 .
KAVDIR, İ., & Guyer, D., (2000). Artificial neural networks machine vision and surface reflectance spectra for apple defect detection . ASAE Annual International Meeting, Milwaukee, WI July 2000
KAVDIR, İSMAİL, And DE Guyer. "Artificial neural networks machine vision and surface reflectance spectra for apple defect detection," ASAE Annual International Meeting, Milwaukee, WI July 2000, 2000
KAVDIR, İSMAİL And Guyer, DE. "Artificial neural networks machine vision and surface reflectance spectra for apple defect detection." ASAE Annual International Meeting, Milwaukee, WI July 2000 , 2000
KAVDIR, İ. And Guyer, D. (2000) . "Artificial neural networks machine vision and surface reflectance spectra for apple defect detection." ASAE Annual International Meeting, Milwaukee, WI July 2000 .
@conferencepaper{conferencepaper, author={İSMAİL KAVDIR And author={DE Guyer}, title={Artificial neural networks machine vision and surface reflectance spectra for apple defect detection}, congress name={ASAE Annual International Meeting, Milwaukee, WI July 2000}, city={}, country={}, year={2000}}