Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform


ÖZCAN S., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.

THIN SOLID FILMS, cilt.692, 2019 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 692
  • Basım Tarihi: 2019
  • Doi Numarası: 10.1016/j.tsf.2019.137602
  • Dergi Adı: THIN SOLID FILMS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Anahtar Kelimeler: Dielectric films, Physical thickness, Refractive index dispersion, Transmittance spectrum, OPTICAL-CONSTANTS, ALGORITHM
  • Çanakkale Onsekiz Mart Üniversitesi Adresli: Evet

Özet

The continuous wavelet transform with Paul wavelet was proposed as a method for the simultaneous determination of physical thickness and refractive index dispersion of dielectric films in the visible and near infrared region. Transmittance spectrums, acquired at two different incident angles, were used for the calculations. By this way refractive index dispersion was obtained without knowing the film thickness. The method was tested with simulated data and experimentally applied to a sample of borosilicate glass. The obtained thickness and refractive index dispersion values were compared to the values obtained by the envelope method and the ones provided by the manufacturer.