S-transform analysis of projected fringe patterns - art. no. 66161A

Kocahan O., ÖZDER S. , COŞKUN E.

Conference on Optical Measurement Systems for Industrial Inspection V, Munich, Almanya, 18 - 22 Haziran 2007, cilt.6616 identifier identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası: 6616
  • Doi Numarası: 10.1117/12.725786
  • Basıldığı Şehir: Munich
  • Basıldığı Ülke: Almanya


3D profile measurement of an object is studied experimentally by using a standard fringe projection technique consisting of a CCD camera and a digital projector. The height profile of the object is calculated through the phase change distribution of the projected fringes with two dimensional fringe pattern by introducing the carrier frequencies in two spatial directions, x and y. The phase distribution is extracted from the optical fringe pattern by using S-transform gradient and S-transform phase methods. Experimental result for the Fourier transform profilometry algorithm is compared with the results of the S-transform analysis.