Determination of K shell fluorescence yields of hf compounds at 123.6 keV


Aylikci V., Apaydin G., KAYA N. , Cengiz E., Tirasolu E.

6th International Conference of the Balkan-Physical-Union, İstanbul, Türkiye, 22 - 26 Ağustos 2006, cilt.899, ss.163-164 identifier identifier

  • Cilt numarası: 899
  • Doi Numarası: 10.1063/1.2733087
  • Basıldığı Şehir: İstanbul
  • Basıldığı Ülke: Türkiye
  • Sayfa Sayıları: ss.163-164

Özet

The aim of this study was to determine of K shell fluorescence yields (omega(K)) of Hf compounds. The targets were irradiated with gamma-photons at 123.6 keV from Co-57 annular source. The K X-rays from different targets were dedected using a (Ultra-LEGe) semiconductor dedector with a resolution of 150 eV at 5.9 keV. The measured K shell fluorescence yields results compare with the literature semi-emprical prediction that taken from Krause [1].