Sentiment Classification: Feature Selection Based Approaches Versus Deep Learning


UYSAL A. K., MURPHEY Y. L.

17th IEEE International Conference on Computer and Information Technology (CIT 2017), Helsinki, Finland, 21 - 23 August 2017 identifier identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/cit.2017.53
  • City: Helsinki, Finland
  • Çanakkale Onsekiz Mart University Affiliated: No