Determination of the Refractive Index of Dielectric Films from the Transmittance Spectrum by Using Morse Wavelet

TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E., ELMAS M. N., ÖZDER S.

Science and Applications of Thin Films, Conference & Exhibition SATF 2016, 19 - 23 September 2016

  • Publication Type: Conference Paper / Summary Text
  • Çanakkale Onsekiz Mart University Affiliated: Yes