An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

Tiryaki E., KOCAHAN YILMAZ Ö., ÖZDER S.

MEASUREMENT SCIENCE REVIEW, vol.21, no.2, pp.61-66, 2021 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 21 Issue: 2
  • Publication Date: 2021
  • Doi Number: 10.2478/msr-2021-0009
  • Journal Name: MEASUREMENT SCIENCE REVIEW
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Compendex, INSPEC, Directory of Open Access Journals
  • Page Numbers: pp.61-66
  • Çanakkale Onsekiz Mart University Affiliated: Yes

Abstract

The Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically generated reflectance spectrum in the range of 300-1200 nm wavelength was analyzed by the Continuous Wavelet Transform (CWT) and the refractive index dispersion was obtained by the mentioned method. In addition, a noisy reflectance spectrum was analyzed to show the advantages of the CWT method. Refractive index dispersions calculated by the Morlet and the Paul wavelet were compared to GMW at the end of the study.