The zero order generalized Morse wavelet method to determine the refractive index and extinction coefficient dispersions of an absorbing film

KOCAHAN YILMAZ Ö., COŞKUN E., Tiryaki E., ÖZDER S.

THIN SOLID FILMS, cilt.673, ss.72-77, 2019 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 673
  • Basım Tarihi: 2019
  • Doi Numarası: 10.1016/j.tsf.2019.01.032
  • Dergi Adı: THIN SOLID FILMS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.72-77
  • Anahtar Kelimeler: Absorbing thin film, Refractive index, Extinction coefficient, Generalized Morse wavelet, BIREFRINGENCE DISPERSION, OPTICAL-CONSTANTS, THICKNESS, ALGORITHM
  • Çanakkale Onsekiz Mart Üniversitesi Adresli: Evet

Özet

The zero order generalized Morse wavelet was proposed as a method to determine the refractive index and extinction coefficient dispersions of an absorbing thin film in the visible and near infrared regions at room temperature. The generalized Morse wavelet has two degree of freedom and the advantages and disadvantages of additional degree of freedom were discussed in the simulation works. The simulation studies were based on the mean relative error and Cauchy coefficients comparisions, and accuracy of the calculated refractive index was improved by the presented method, were compared with the Morlet wavelet and Paul wavelet. Also, the noise immunity of the method was discussed. The experimental validity of the method was tested on a cadmium sulfide absorbing thin film and the calculated refractive index were cross checked with the value of envelope method and literature.