Eğitim Bilgileri
2012 - 2014
2012 - 2014Post Doktora
Orta Doğu Teknik Üniversitesi, Fen Edebiyat Fakültesi, Fizik, Türkiye
2005 - 2012
2005 - 2012Doktora
Çanakkale Onsekiz Mart Üniversitesi, Fen Edebiyat Fakültesi, Fizik, Türkiye
2003 - 2005
2003 - 2005Yüksek Lisans
Gebze Yüksek Teknoloji Enstitüsü, Fen Bilimleri Enstitüsü, Fizik, Türkiye
1996 - 2003
1996 - 2003Lisans
Hacettepe Üniversitesi, Mühendislik Fakültesi, Fizik Mühendisliği, Türkiye
Yaptığı Tezler
2012
2012Doktora
İnce filmlerin optik özelliklerinin integral dönüşüm yöntemleri ile incelenmesi
Çanakkale Onsekiz Mart Üniversitesi, Fen Edebiyat Fakültesi, Fizik
2005
2005Yüksek Lisans
TlGaSe2 kristalinin ısıl uyarılmış akım yöntemi ile incelenmesi
Gebze Yüksek Teknoloji Enstitüsü, Fen Bilimleri Enstitüsü, Fizik
Yabancı Diller
B2 Orta Üstü
B2 Orta Üstüİngilizce
Araştırma Alanları
Fizik, Yoğun Madde 1:Yapısal, Mekanik ve Termal Özellikler , Yüzeyler ve arayüzeyler; İnce filmler ve nanosistemler, Yoğun Madde 2:Elektronik Yapı, Elektrik, Manyetik ve Optik Özellikler, Elektronik yapı, arayüzeylerin, ince filmlerin ve düşük boyutlu yapıların elektrik özellikleri, Optik özellikler, Yoğun madde spektroskopisi, Temel Bilimler
Akademik Unvanlar / Görevler
2005 - Devam Ediyor
2005 - Devam EdiyorAraştırma Görevlisi Dr.
Çanakkale Onsekiz Mart Üniversitesi, Fen Edebiyat Fakültesi, Fizik
SCI, SSCI ve AHCI İndekslerine Giren Dergilerde Yayınlanan Makaleler
2021
2021Improvement of electrical characteristics of SnSe/Si heterostructure by integration of Si nanowires
COŞKUN E. , Gullu H. H. , Emir C., PARLAK M.
PHYSICA B-CONDENSED MATTER, cilt.604, 2021 (SCI İndekslerine Giren Dergi)
2019
2019Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform
ÖZCAN S. , COŞKUN E. , KOCAHAN YILMAZ Ö., ÖZDER S.
THIN SOLID FILMS, cilt.692, 2019 (SCI İndekslerine Giren Dergi)
2019
2019FABRICATION AND CHARACTERIZATION OF TiO2 THIN FILM FOR DEVICE APPLICATIONS
Hosseini A., Gullu H. H. , Coskun E. , Parlak M., Ercelebi C.
SURFACE REVIEW AND LETTERS, cilt.26, sa.6, 2019 (SCI İndekslerine Giren Dergi)
2019
2019The zero order generalized Morse wavelet method to determine the refractive index and extinction coefficient dispersions of an absorbing film
KOCAHAN YILMAZ Ö., COŞKUN E. , Tiryaki E., ÖZDER S.
THIN SOLID FILMS, cilt.673, ss.72-77, 2019 (SCI İndekslerine Giren Dergi)
2018
2018Determination of phase from the ridge of CWT using generalized Morse wavelet
KOCAHAN YILMAZ Ö., Tiryaki E., COŞKUN E. , ÖZDER S.
MEASUREMENT SCIENCE AND TECHNOLOGY, cilt.29, sa.3, 2018 (SCI İndekslerine Giren Dergi)
2017
2017The generalized Morse wavelet method to determine refractive index dispersion of dielectric films
KOCAHAN YILMAZ Ö., ÖZCAN S. , COŞKUN E. , ÖZDER S.
MEASUREMENT SCIENCE AND TECHNOLOGY, cilt.28, sa.4, 2017 (SCI İndekslerine Giren Dergi)
2017
2017Investigations of thermal annealing role on the optical properties of Zn-In-Se thin films
Gullu H. H. , COŞKUN E. , Parlak M.
OPTIK, cilt.144, ss.603-612, 2017 (SCI İndekslerine Giren Dergi)
2015
2015Generalized Morse wavelet for the determination of the birefringence of a liquid crystal cell
KOCAHAN YILMAZ Ö., COŞKUN E. , ÖZDER S.
MEASUREMENT SCIENCE AND TECHNOLOGY, cilt.26, sa.8, 2015 (SCI İndekslerine Giren Dergi)
2015
2015Device behavior of an In/p-Ag(Ga,In)Te-2/n-Si/Ag heterojunction diode
COŞKUN E. , Gullu H. H. , CANDAN İ., Bayrakli O., PARLAK M., Ercelebi C.
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, cilt.34, ss.138-145, 2015 (SCI İndekslerine Giren Dergi)
2015
2015Study on the Structural and Electrical Properties of Sequentially Deposited Ag-Ga-In-Te Thin Films
COŞKUN E. , Gullu H. H. , Parlak M., Ercelebi C.
JOURNAL OF LOW TEMPERATURE PHYSICS, cilt.178, ss.162-173, 2015 (SCI İndekslerine Giren Dergi)
2015
2015Investigation of structural and optical parameters of Cu-Ag-In-Se thin films deposited by thermal evaporation method
Gullu H. H. , CANDAN İ., COŞKUN E. , Parlak M.
OPTIK, cilt.126, sa.18, ss.1578-1583, 2015 (SCI İndekslerine Giren Dergi)
2014
2014Characterization of Co-evaporated Cu-Ag-In-Se Thin Films
Gullu H. H. , COŞKUN E. , Parlak M.
BRAZILIAN JOURNAL OF PHYSICS, cilt.44, sa.6, ss.719-725, 2014 (SCI İndekslerine Giren Dergi)
2014
2014Device application of AgGa0.5In0.5Se2 thin films deposited by thermal sequential stacked layer method
COŞKUN E. , Gullu H. H. , Parlak M.
MATERIALS RESEARCH EXPRESS, cilt.1, sa.4, 2014 (SCI İndekslerine Giren Dergi)
2014
2014Generalized Morse wavelets for the phase evaluation of projected fringe pattern
KOCAHAN YILMAZ Ö., COŞKUN E. , ÖZDER S.
MEASUREMENT SCIENCE AND TECHNOLOGY, cilt.25, sa.10, 2014 (SCI İndekslerine Giren Dergi)
2013
2013The Paul wavelet algorithm: an alternative approach to calculate the refractive index dispersion of a dielectric film from transmittance spectrum
COŞKUN E. , ÖZDER S. , Tiryaki E.
APPLIED PHYSICS B-LASERS AND OPTICS, cilt.113, sa.2, ss.243-250, 2013 (SCI İndekslerine Giren Dergi)
2013
2013Structural and optical properties of Zn-In-Te thin films deposited by thermal evaporation technique
Gullu H. H. , Bayrakli O., CANDAN İ., COŞKUN E. , Parlak M.
JOURNAL OF ALLOYS AND COMPOUNDS, cilt.566, ss.83-89, 2013 (SCI İndekslerine Giren Dergi)
2011
2011Paul wavelet algorithm for the determination of birefringence dispersion of a liquid crystal cell
COŞKUN E. , ÖZDER S.
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, cilt.28, sa.12, ss.2974-2978, 2011 (SCI İndekslerine Giren Dergi)
2010
2010Determination of the refractive index of a dielectric film continuously by the generalized S-transform
COŞKUN E. , SEL K. , ÖZDER S.
OPTICS LETTERS, cilt.35, sa.6, ss.841-843, 2010 (SCI İndekslerine Giren Dergi)
2008
2008Refractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet transform method
COŞKUN E. , SEL K. , ÖZDER S. , KURT M.
APPLIED OPTICS, cilt.47, sa.27, ss.4888-4894, 2008 (SCI İndekslerine Giren Dergi)
2007
2007Determination of birefringence dispersion in nematic liquid crystals by using an S-transform
Ozder S. , COŞKUN E. , Koysal O., Kocahan O.
OPTICS LETTERS, cilt.32, sa.14, ss.2001-2003, 2007 (SCI İndekslerine Giren Dergi)
2007
2007Optical phase distribution evaluation by using an S-transform
Ozder S. , KOCAHAN O., COŞKUN E. , Goktas H.
OPTICS LETTERS, cilt.32, sa.6, ss.591-593, 2007 (SCI İndekslerine Giren Dergi)
2006
2006The effect of thermal annealing on impurity states in ferroelectric-semiconductor TlGaSe2 within the incommensurate phase
Seyidov M., COŞKUN E. , Sahin Y., Khamoev R., Suleymanov R.
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, cilt.21, sa.2, ss.171-174, 2006 (SCI İndekslerine Giren Dergi)
Hakemli Kongre / Sempozyum Bildiri Kitaplarında Yer Alan Yayınlar
2019
2019Determination of surface profile of thin films by continuous wavelet transform.
TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E. , ÖZDER S.
6. International Conference of Material Science and Nanotechnology for Next Generation (MSNG2019), Kayseri, Türkiye, 16 - 17 Ekim 2019
2018
2018Electrical Properties of ZnSe/Si Nanowire and ZnSe/Si Heterostructures
BOZDOĞAN E., COŞKUN E. , ÖZDER S. , GÜLLÜ H. H. , PARLAK M.
Turkish Physical Society 34th International Physics Congress (TFD-34), Muğla, Türkiye, 5 - 09 Eylül 2018
2017
2017n-ZnSe/p-Si Nanotel Heteroeklemlerin Foto-İletkenlik Davranışlarının İncelenmesi
COŞKUN E. , GÜLLÜ H. H. , PARLAK M.
23. Yoğun Madde Fiziği Ankara Toplantısı, Ankara, Türkiye, 22 Aralık 2017
2017
2017Determination of the Interface Properties of p-CZTSe/n-Si Nanowire Heterojunction Diode
BAYRAKLI Ö., TERLEMEZOĞLU M., GÜLLÜ H. H. , YILDIZ D. E. , ÇOLAKOĞLU T., COŞKUN E. , et al.
Materials Research Society (MRS) 2017 Fall Meeting, Boston, 26 Kasım - 01 Aralık 2017
2017
2017Optical properties of slicon nanowires for different length fabricated by metal assisted chemical ethcing method
BOZDOĞAN E., COŞKUN E. , ÖZDER S. , KOCAHAN YILMAZ Ö.
Turkish Physical Society 33th International Physics Congress, 6 - 09 Eylül 2017
2017
2017Production of silicon nanowire having different size by using metal assisted chemical etching method
BOZDOĞAN E., COŞKUN E. , ÖZDER S. , KOCAHAN YILMAZ Ö.
Turkish Physical Society 33th International Physics Congress, 6 - 09 Eylül 2017
2017
2017Synthesis and Structural Characterization on the (Cu,Ag)GaTe2 Thin Films Deposited on Si Nanowires
COŞKUN E. , GÜLLÜ H. H. , BAYRAKLI Ö., TERLEMEZOĞLU M., PARLAK M.
European Materials Research Society-Spring Meeting 2017, 22 - 26 Mayıs 2017
2016
2016An Improved Method For Determination Of Refractive Index Of Absorbing Films: A Simulation Study
ÖZCAN S. , COŞKUN E. , KOCAHAN YILMAZ Ö., ÖZDER S.
32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815
2016
20163D Profile Measurements of Objects by Using Zero Order Generalized Morse Wavelet
KOCAHAN YILMAZ Ö., Durmus C., Elmas M. N. , COŞKUN E. , Tiryaki E., ÖZDER S.
32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815
2016
2016Optical Phase Distribution Evaluation by Using Zero Order Generalized Morse Wavelet
KOCAHAN YILMAZ Ö., Elmas M. N. , Durmus C., COŞKUN E. , Tiryaki E., ÖZDER S.
32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815
2016
2016A Simulation Study for Determination of Refractive Index Dispersion of Dielectric Film from Reflectance Spectrum by Using Paul Wavelet
Tiryaki E., COŞKUN E. , KOCAHAN YILMAZ Ö., ÖZDER S.
32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815
2017
2017Quantitative Phase Imaging of Red Blood Cell by Diffraction Phase Microscopy
KOCAHAN YILMAZ Ö., Tiryaki E., Durmus C., Elmas M. N. , COŞKUN E. , ÖZDER S.
International Workshop on Computing and Electromagnetics (CEM), Barcelona, İspanya, 21 - 24 Haziran 2017, ss.21-22
2016
2016An Improved Method For Simultaneous Determination Of Refractive Index And Thickness Of Dielectric Films A Simulation Study
ÖZCAN S. , COŞKUN E. , KOCAHAN YILMAZ Ö., ÖZDER S.
Science and Applications of Thin Films, Congress & Exhibition - SATF 2016, İzmir, Türkiye, 19 - 23 Eylül 2016
2016
2016Design and Device Application of Si Based Cu Ag Ga Te Thin Film Heterojunction
GÜLLÜ H. H. , COŞKUN E. , BAYRAKLI Ö., PARLAK M.
Science and Application of Thin Films, Conference and Exhibition, 19 - 23 Eylül 2016
2016
2016Determination of the Refractive Index of Dielectric Films from the Transmittance Spectrum by Using Morse Wavelet
TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E. , ELMAS M. N. , ÖZDER S.
Science and Applications of Thin Films, Conference & Exhibition SATF 2016, 19 - 23 Eylül 2016
2016
2016Theoretical Determination of the Refractive Index and Extinction Coefficient of an Absorbing Thin Film by Using Morse Wavelet
TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E. , DURMUŞ Ç., ÖZDER S.
Science and Applications of Thin Films, Conference & Exhibition (SATF 2016), 19 - 23 Eylül 2016
2016
2016A simulation study for determination of refractive index dispersion of dielectric film from reflectance spectrum by using Paul wavelet
TİRYAKİ E., COŞKUN E. , ÖZDER S. , BOZDOĞAN E., KOCAHAN YILMAZ Ö., ELMAS M. N.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016
2016
2016Determination of the refractive index dispersion of dielectric film from reflectance spectrum by using Morlet wavelet
TİRYAKİ E., COŞKUN E. , ÖZDER S. , KUŞ E., KOCAHAN YILMAZ Ö., DURMUŞ Ç.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016
2016
20163D profile measurements of objects by using zero order generalized Morse wavelet
KOCAHAN YILMAZ Ö., DURMUŞ Ç., ELMAS M. N. , COŞKUN E. , TİRYAKİ E., ÖZDER S.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016
2016
2016An improved method for determination of refractive index of absorbing fılms a simulation study
ÖZCAN S. , COŞKUN E. , ÖZDER S. , KOCAHAN YILMAZ Ö.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016
2016
2016Optical phase distribution evaluation by using zero order generalized Morse wavelet
KOCAHAN YILMAZ Ö., ELMAS M. N. , DURMUŞ Ç., COŞKUN E. , TİRYAKİ E., ÖZDER S.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016
2016
2016Fabrication and Characterization of p CuInSe2 n Si Heterojuntion Diodes
GÜLLÜ H. H. , BAYRAKLI Ö., COŞKUN E. , PARLAK M.
32nd European Photovoltaic Solar Energy Conference and Exhibition, 20 - 24 Haziran 2016
2016
2016Effect of Nanowire Length on Device Performance of n ZnSe p Si Nanowire Heretojunctions
COŞKUN E. , GÜLLÜ H. H. , ÇOLAKOĞLU T., BAYRAKLI Ö., PARLAK M.
32nd European Photovoltaic Solar Energy Conference and Exhibition, 20 - 24 Haziran 2016
2016
2016Characterization of CZTSe Thin Films for Solar Cell
BAYRAKLI Ö., GÜLLÜ H. H. , TERLEMEZOĞLU M., PARLAK M., COŞKUN E.
32nd European Photovoltaic Solar Energy Conference and Exhibition, 20 - 24 Haziran 2016
2016
2016Device characterization of Zn Sn Se ZTSe thin films for solar cell
BAYRAKLI Ö., GÜLLÜ H. H. , COŞKUN E. , PARLAK M.
European Materials Research Society 2016, 2 - 06 Mayıs 2016
2016
2016Effect of nanowire length on device performance of n In2Se3 p Si heterojuntions
COŞKUN E. , ÇOLAKOĞLU T., GÜLLÜ H. H. , BAYRAKLI Ö., PARLAK M.
European Materials Research Society 2016, 2 - 06 Mayıs 2016
2016
2016Studies on Device Properties of n ZnSe p Si Heterojuntion Diode
GÜLLÜ H. H. , BAYRAKLI Ö., COŞKUN E. , PARLAK M.
European Materials Research Society 2016, 2 - 06 Mayıs 2016
2016
2016Optical Behaviour of Sequantial Thermal Evaporation ZnInSe2 Thin Films
GÜLLÜ H. H. , COŞKUN E. , BAYRAKLI Ö., PARLAK M.
European Materials Research Society 2016, 2 - 06 Mayıs 2016
2016
2016Device characterization of Cu Ag Ga Te thin films for photovoltaic applications
COŞKUN E. , GÜLLÜ H. H. , PARLAK M.
Materials Research Society 2016, 28 Mart - 01 Nisan 2016
2015
2015An Improved Method For The Determination Of Birefringence Dispersion Of Liquid Crystal Cell: A Simulation Study
ÖZCAN S. , COŞKUN E. , KOCAHAN YILMAZ Ö., ÖZDER S.
9th International Physics Conference of the Balkan-Physical-Union (BPU), İstanbul, Türkiye, 24 - 27 Ağustos 2015, cilt.1722
2015
2015Investigation of Electrical Properties of Cu Ag In Se Thin Films Deposited by Thermally Evaporation Method
GÜLLÜ H. H. , COŞKUN E. , BAYRAKLI Ö., PARLAK M., ERÇELEBİ A. Ç.
EU PVSEC 2015 31st European Photovoltaic Solar Energy Conference and Exhibition, 14 - 18 Eylül 2015
2015
2015Fabrication and Characterization of p AgGaxIn1 xTe2 n ZnInSe2 Heterojunctions for Solar Cell Applications
BAYRAKLI Ö., GÜLLÜ H. H. , COŞKUN E. , PARLAK M.
2015 MRS Spring Meeting & Exhibit, 6 - 10 Nisan 2015
2015
2015Material and Device Characterization of Cu0 5Ag0 5InSe2 and ZnInSe2 Thin Films for Photovoltaic Applications
GÜLLÜ H. H. , COŞKUN E. , BAYRAKLI Ö., PARLAK M.
2015 MRS Spring Meeting & Exhibit, 6 - 10 Nisan 2015
2015
2015Investigation of optical parameters of thermally evaporated ZnSe thin films
Gullu H. H. , COŞKUN E. , Parlak M.
3rd Turkish Solar Electricity Conference and Exhibition (SolarTR), Ankara, Türkiye, 27 - 29 Nisan 2015, cilt.12, ss.1224-1228
2014
2014Characterization of Sputtered Cu Zn Sn Te Thin Films for Device Applications
Hosseini A., GÜLLÜ H. H. , COŞKUN E. , TURAN R., ERÇELEBİ A. Ç.
E-MRS 2014, 03 Haziran 2014
2014
2014Fabrication and Characterization of TiO2Thin Films for Device Applications
HOSSEINI A., GÜLLÜ H. H. , COŞKUN E. , TURAN R., ERÇELEBİ A. Ç.
E-MRS 2014, 20 - 22 Nisan 2014
2008
2008PLAZMA DESTEKLİ KİMYASAL BUHAR BİRİKTİRME SİSTEMİ İLE BÜYÜTÜLEN HİDROJENLENMİŞ AMORF SİLİSYUM KARBÜR İNCE FİLMLERE RADYO FREKANSI GÜCÜ ETKİSİNİN X ISINI FOTOELEKTRON SPEKTROMETRESİ İLE İNCELENMESİ
GÜLLÜ H. H. , COŞKUN E. , PARLAK M.
MYOMAT 2009: I.ULUSAL METAL, YARIĐLETKEN veOKSĐT MATERYALLERĐN ÜRETĐMĐNDEKULLANILAN SĐSTEMLER ve ANALİZ TEKNİKLERİ KONGRESİ, Türkiye, 20 - 22 Nisan 2008
2008
2008Profile Measurement of Objects by Using Stockwell and Continuous Wavelet Transforms
Kocahan O., COŞKUN E. , ÖZDER S.
IEEE 16th Signal Processing and Communications Applications Conference, Aydın, Türkiye, 20 - 22 Nisan 2008, ss.804-807
2007
2007S-transform analysis of projected fringe patterns - art. no. 66161A
Kocahan O., ÖZDER S. , COŞKUN E.
Conference on Optical Measurement Systems for Industrial Inspection V, Munich, Almanya, 18 - 22 Haziran 2007, cilt.6616
2006
2006Optical phase distribution evaluation by using S-transform
Kocallan O., ÖZDER S. , COŞKUN E.
6th International Conference of the Balkan-Physical-Union, İstanbul, Türkiye, 22 - 26 Ağustos 2006, cilt.899, ss.684
2006
2006The determination of birefringence dispersion in nematic liquid crystals by using the S-transform
COŞKUN E. , Oezder S., Kocahan O., Koeysal O.
6th International Conference of the Balkan-Physical-Union, İstanbul, Türkiye, 22 - 26 Ağustos 2006, cilt.899, ss.439-440
Desteklenen Projeler
2010 - 2012
2010 - 2012İnce Filmlerin Optik Özelliklerinin İntegral Dönüşüm Yöntemleri İle Belirlenmesi
Yükseköğretim Kurumları Destekli Proje
ÖZDER S. (Yürütücü) , COŞKUN E.
Bilimsel Hakemlikler
Mart 2010
Mart 2010