Yayınlar & Eserler

Yayın Ağı
Makaleler 29
Tümü (29)
SCI-E, SSCI, AHCI (27)
SCI-E, SSCI, AHCI, ESCI (27)
Scopus (27)
Diğer Yayınlar (2)

1. Structural and Optical Properties of Interfacial InSe Thin Film

Emir C., TATAROĞLU A., COŞKUN E., BİLGE OCAK S.
ACS OMEGA , sa.7, ss.7588-7596, 2024 (SCI-Expanded) identifier identifier identifier

2. A new method to determine the continuous refractive index of an absorbing film by Generalized Stockwell Transform

COŞKUN E., Emir C., Selamet S., PARLAK M., ÖZDER S.
Optics and Laser Technology , cilt.167, 2023 (SCI-Expanded) identifier

3. Nanowire geometry effects on devices and transport mechanisms: SnS2/SiNW heterojunction

Coşkun E., Emir C., Terlemezoglu M., Parlak M.
JOURNAL OF MATERIALS SCIENCE , cilt.58, ss.15132-15143, 2023 (SCI-Expanded)

4. Improvement of electrical characteristics of SnSe/Si heterostructure by integration of Si nanowires

Coşkun E., Gullu H. H., Emir C., Parlak M.
PHYSICA B-CONDENSED MATTER , cilt.604, 2021 (SCI-Expanded) identifier identifier

5. Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform

ÖZCAN S., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.
THIN SOLID FILMS , cilt.692, 2019 (SCI-Expanded) identifier identifier

6. FABRICATION AND CHARACTERIZATION OF TiO2 THIN FILM FOR DEVICE APPLICATIONS

Hosseini A., Gullu H. H., Coskun E., Parlak M., Ercelebi C.
SURFACE REVIEW AND LETTERS , cilt.26, sa.6, 2019 (SCI-Expanded) identifier identifier

7. Effects of Si nanowire on the device properties of n-ZnSe/p-Si heterostructure

Coskun E., Gullu H. H., Colakoglu T., Emir C., Bozdogan E., Parlak M.
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , cilt.30, sa.5, ss.4760-4765, 2019 (SCI-Expanded) identifier identifier

8. The zero order generalized Morse wavelet method to determine the refractive index and extinction coefficient dispersions of an absorbing film

KOCAHAN YILMAZ Ö., COŞKUN E., Tiryaki E., ÖZDER S.
THIN SOLID FILMS , cilt.673, ss.72-77, 2019 (SCI-Expanded) identifier identifier

9. Optical band gap and dispersion of optical constants of Cu-Ga-S thin films

Isik M., Gullu H. H., Coskun E., HASANLI N.
OPTIK , cilt.186, ss.147-154, 2019 (SCI-Expanded) identifier identifier

10. Determination of phase from the ridge of CWT using generalized Morse wavelet

KOCAHAN YILMAZ Ö., Tiryaki E., COŞKUN E., ÖZDER S.
MEASUREMENT SCIENCE AND TECHNOLOGY , cilt.29, sa.3, 2018 (SCI-Expanded) identifier identifier

11. The generalized Morse wavelet method to determine refractive index dispersion of dielectric films

KOCAHAN YILMAZ Ö., ÖZCAN S., COŞKUN E., ÖZDER S.
MEASUREMENT SCIENCE AND TECHNOLOGY , cilt.28, sa.4, 2017 (SCI-Expanded) identifier identifier

12. An improved method for determination of refractive index of absorbing films: A simulation study

Özcan S., Coşkun E., Kocahan Yılmaz Ö., Özder S.
AIP Conference Proceedings , cilt.1815, ss.500091-500094, 2017 (Hakemli Dergi) Creative Commons License

13. Investigations of thermal annealing role on the optical properties of Zn-In-Se thin films

Gullu H. H., COŞKUN E., Parlak M.
OPTIK , cilt.144, ss.603-612, 2017 (SCI-Expanded) identifier identifier

14. An Improved Method For The Determination Of Birefringence Dispersion Of Liquid Crystal Cell: A Simulation Study

Özcan S., Coşkun E., Kocahan Yılmaz Ö., Özder S.
AIP Conference Proceedings , cilt.1722, sa.1, ss.900021-900024, 2016 (Düzenli olarak gerçekleştirilen hakemli kongrenin bildiri kitabı) Creative Commons License

15. Generalized Morse wavelet for the determination of the birefringence of a liquid crystal cell

KOCAHAN YILMAZ Ö., COŞKUN E., ÖZDER S.
MEASUREMENT SCIENCE AND TECHNOLOGY , cilt.26, sa.8, 2015 (SCI-Expanded) identifier identifier

16. Device behavior of an In/p-Ag(Ga,In)Te-2/n-Si/Ag heterojunction diode

COŞKUN E., Gullu H. H., CANDAN İ., Bayrakli O., PARLAK M., Ercelebi C.
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , cilt.34, ss.138-145, 2015 (SCI-Expanded) identifier identifier

17. Study on the Structural and Electrical Properties of Sequentially Deposited Ag-Ga-In-Te Thin Films

COŞKUN E., Gullu H. H., Parlak M., Ercelebi C.
JOURNAL OF LOW TEMPERATURE PHYSICS , cilt.178, ss.162-173, 2015 (SCI-Expanded) identifier identifier

18. Investigation of structural and optical parameters of Cu-Ag-In-Se thin films deposited by thermal evaporation method

Gullu H. H., CANDAN İ., COŞKUN E., Parlak M.
OPTIK , cilt.126, sa.18, ss.1578-1583, 2015 (SCI-Expanded) identifier identifier

19. Characterization of Co-evaporated Cu-Ag-In-Se Thin Films

Gullu H. H., COŞKUN E., Parlak M.
BRAZILIAN JOURNAL OF PHYSICS , cilt.44, sa.6, ss.719-725, 2014 (SCI-Expanded) identifier identifier

20. Device application of AgGa0.5In0.5Se2 thin films deposited by thermal sequential stacked layer method

COŞKUN E., Gullu H. H., Parlak M.
MATERIALS RESEARCH EXPRESS , cilt.1, sa.4, 2014 (SCI-Expanded) identifier identifier

21. Generalized Morse wavelets for the phase evaluation of projected fringe pattern

KOCAHAN YILMAZ Ö., COŞKUN E., ÖZDER S.
MEASUREMENT SCIENCE AND TECHNOLOGY , cilt.25, sa.10, 2014 (SCI-Expanded) identifier identifier

22. The Paul wavelet algorithm: an alternative approach to calculate the refractive index dispersion of a dielectric film from transmittance spectrum

COŞKUN E., ÖZDER S., Tiryaki E.
APPLIED PHYSICS B-LASERS AND OPTICS , cilt.113, sa.2, ss.243-250, 2013 (SCI-Expanded) identifier identifier

23. Structural and optical properties of Zn-In-Te thin films deposited by thermal evaporation technique

Gullu H. H., Bayrakli O., CANDAN İ., COŞKUN E., Parlak M.
JOURNAL OF ALLOYS AND COMPOUNDS , cilt.566, ss.83-89, 2013 (SCI-Expanded) identifier identifier

24. Paul wavelet algorithm for the determination of birefringence dispersion of a liquid crystal cell

COŞKUN E., ÖZDER S.
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS , cilt.28, sa.12, ss.2974-2978, 2011 (SCI-Expanded) identifier identifier

25. Determination of the refractive index of a dielectric film continuously by the generalized S-transform

COŞKUN E., SEL K., ÖZDER S.
OPTICS LETTERS , cilt.35, sa.6, ss.841-843, 2010 (SCI-Expanded) identifier identifier identifier

26. Refractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet transform method

COŞKUN E., SEL K., ÖZDER S., KURT M.
APPLIED OPTICS , cilt.47, sa.27, ss.4888-4894, 2008 (SCI-Expanded) identifier identifier identifier

27. Determination of birefringence dispersion in nematic liquid crystals by using an S-transform

Ozder S., COŞKUN E., Koysal O., Kocahan O.
OPTICS LETTERS , cilt.32, sa.14, ss.2001-2003, 2007 (SCI-Expanded) identifier identifier identifier

28. Optical phase distribution evaluation by using an S-transform

Ozder S., KOCAHAN O., COŞKUN E., Goktas H.
OPTICS LETTERS , cilt.32, sa.6, ss.591-593, 2007 (SCI-Expanded) identifier identifier identifier

29. The effect of thermal annealing on impurity states in ferroelectric-semiconductor TlGaSe2 within the incommensurate phase

Seyidov M., COŞKUN E., Sahin Y., Khamoev R., Suleymanov R.
SEMICONDUCTOR SCIENCE AND TECHNOLOGY , cilt.21, sa.2, ss.171-174, 2006 (SCI-Expanded) identifier identifier
Hakemli Bilimsel Toplantılarda Yayımlanmış Bildiriler 46

1. Numerical Approach for Determination of The Refractive Index of Dielectric Film from Reflectance Spectrum at Various Angles of Incidence by Using Paul Wavelet

SELAMET S., TİRYAKİ E., Emir C., COŞKUN E.
Türk Fizik Derneği 39. Kongresi (2023), Muğla, Türkiye, 31 Ağustos - 04 Eylül 2023, ss.128, (Özet Bildiri)

2. Surface Profile Determination by Generalized Morse Wavelet: A Simulation Study

UYANIK M., SELAMET S., KOCAHAN YILMAZ Ö., COŞKUN E.
Türk Fizik Derneği 38. Kongresi (2022), Muğla, Türkiye, 31 Ağustos 2022, (Özet Bildiri)

3. Determination of the theoretically created surface profile by Generalized S-Transform

SELAMET S., KOCAHAN YILMAZ Ö., COŞKUN E.
Türk Fizik Derneği 38. Kongresi (2022), Muğla, Türkiye, 31 Ağustos 2022, (Özet Bildiri)

4. Cardiac tissue models to investigate the heart mechanobiology

Zanetti M., Andolfi L., Guttner E. B., COŞKUN E., BEK A., Taylor M. R., et al.
Crossnano Workshop 2022, İtalya, 22 Şubat 2022, (Özet Bildiri)

5. TEMPERATURE DEPENDENT CHARACTERIZATION OF SnS/Si NANOWIRE DEVICE APPLICATION

COŞKUN E., GÜLLÜ H. H., EMİR C., PARLAK M.
Turk Fizik Derneği 36 sempozyum, İstanbul, Türkiye, 01 Eylül 2020, ss.78, (Özet Bildiri)

6. Determination of surface profile of thin films by continuous wavelet transform.

TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E., ÖZDER S.
6. International Conference of Material Science and Nanotechnology for Next Generation (MSNG2019), Kayseri, Türkiye, 16 - 17 Ekim 2019, (Özet Bildiri)

7. Electrical Properties of ZnSe/Si Nanowire and ZnSe/Si Heterostructures

BOZDOĞAN E., COŞKUN E., ÖZDER S., GÜLLÜ H. H., PARLAK M.
Turkish Physical Society 34th International Physics Congress (TFD-34), Muğla, Türkiye, 5 - 09 Eylül 2018, (Özet Bildiri)

8. n-ZnSe/p-Si Nanotel Heteroeklemlerin Foto-İletkenlik Davranışlarının İncelenmesi

COŞKUN E., GÜLLÜ H. H., PARLAK M.
23. Yoğun Madde Fiziği Ankara Toplantısı, Ankara, Türkiye, 22 Aralık 2017, (Özet Bildiri)

9. Determination of the Interface Properties of p-CZTSe/n-Si Nanowire Heterojunction Diode

BAYRAKLI Ö., TERLEMEZOĞLU M., GÜLLÜ H. H., YILDIZ D. E., ÇOLAKOĞLU T., COŞKUN E., et al.
Materials Research Society (MRS) 2017 Fall Meeting, Boston, 26 Kasım - 01 Aralık 2017, (Özet Bildiri)

10. Optical properties of slicon nanowires for different length fabricated by metal assisted chemical ethcing method

BOZDOĞAN E., COŞKUN E., ÖZDER S., KOCAHAN YILMAZ Ö.
Turkish Physical Society 33th International Physics Congress, 6 - 09 Eylül 2017, (Özet Bildiri)

11. Production of silicon nanowire having different size by using metal assisted chemical etching method

BOZDOĞAN E., COŞKUN E., ÖZDER S., KOCAHAN YILMAZ Ö.
Turkish Physical Society 33th International Physics Congress, 6 - 09 Eylül 2017, (Özet Bildiri)

12. Synthesis and Structural Characterization on the (Cu,Ag)GaTe2 Thin Films Deposited on Si Nanowires

COŞKUN E., GÜLLÜ H. H., BAYRAKLI Ö., TERLEMEZOĞLU M., PARLAK M.
European Materials Research Society-Spring Meeting 2017, 22 - 26 Mayıs 2017, (Özet Bildiri)

13. A Simulation Study for Determination of Refractive Index Dispersion of Dielectric Film from Reflectance Spectrum by Using Paul Wavelet

Tiryaki E., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.
32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815, (Tam Metin Bildiri) identifier identifier

14. Optical Phase Distribution Evaluation by Using Zero Order Generalized Morse Wavelet

KOCAHAN YILMAZ Ö., Elmas M. N., Durmus C., COŞKUN E., Tiryaki E., ÖZDER S.
32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815, (Tam Metin Bildiri) identifier identifier

15. Quantitative Phase Imaging of Red Blood Cell by Diffraction Phase Microscopy

KOCAHAN YILMAZ Ö., Tiryaki E., Durmus C., Elmas M. N., COŞKUN E., ÖZDER S.
International Workshop on Computing and Electromagnetics (CEM), Barcelona, İspanya, 21 - 24 Haziran 2017, ss.21-22, (Tam Metin Bildiri) identifier

16. An Improved Method For Determination Of Refractive Index Of Absorbing Films: A Simulation Study

Özcan S., Coşkun E., Kocahan Yılmaz Ö., Özder S.
32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815, (Tam Metin Bildiri) identifier identifier

17. 3D Profile Measurements of Objects by Using Zero Order Generalized Morse Wavelet

KOCAHAN YILMAZ Ö., Durmus C., Elmas M. N., COŞKUN E., Tiryaki E., ÖZDER S.
32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815, (Tam Metin Bildiri) identifier identifier

18. An Improved Method For Simultaneous Determination Of Refractive Index And Thickness Of Dielectric Films A Simulation Study

ÖZCAN S., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.
Science and Applications of Thin Films, Congress & Exhibition - SATF 2016, İzmir, Türkiye, 19 - 23 Eylül 2016

19. Design and Device Application of Si Based Cu Ag Ga Te Thin Film Heterojunction

GÜLLÜ H. H., COŞKUN E., BAYRAKLI Ö., PARLAK M.
Science and Application of Thin Films, Conference and Exhibition, 19 - 23 Eylül 2016, (Özet Bildiri)

20. Determination of the Refractive Index of Dielectric Films from the Transmittance Spectrum by Using Morse Wavelet

TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E., ELMAS M. N., ÖZDER S.
Science and Applications of Thin Films, Conference & Exhibition SATF 2016, 19 - 23 Eylül 2016, (Özet Bildiri)

21. Theoretical Determination of the Refractive Index and Extinction Coefficient of an Absorbing Thin Film by Using Morse Wavelet

TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E., DURMUŞ Ç., ÖZDER S.
Science and Applications of Thin Films, Conference & Exhibition (SATF 2016), 19 - 23 Eylül 2016, (Özet Bildiri)

22. 3D profile measurements of objects by using zero order generalized Morse wavelet

KOCAHAN YILMAZ Ö., DURMUŞ Ç., ELMAS M. N., COŞKUN E., TİRYAKİ E., ÖZDER S.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016, (Özet Bildiri)

23. A simulation study for determination of refractive index dispersion of dielectric film from reflectance spectrum by using Paul wavelet

TİRYAKİ E., COŞKUN E., ÖZDER S., BOZDOĞAN E., KOCAHAN YILMAZ Ö., ELMAS M. N.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016, (Özet Bildiri)

24. Determination of the refractive index dispersion of dielectric film from reflectance spectrum by using Morlet wavelet

TİRYAKİ E., COŞKUN E., ÖZDER S., KUŞ E., KOCAHAN YILMAZ Ö., DURMUŞ Ç.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016, (Özet Bildiri)

25. An improved method for determination of refractive index of absorbing fılms a simulation study

ÖZCAN S., COŞKUN E., ÖZDER S., KOCAHAN YILMAZ Ö.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016, (Özet Bildiri)

26. Optical phase distribution evaluation by using zero order generalized Morse wavelet

KOCAHAN YILMAZ Ö., ELMAS M. N., DURMUŞ Ç., COŞKUN E., TİRYAKİ E., ÖZDER S.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016, (Özet Bildiri)

27. Fabrication and Characterization of p CuInSe2 n Si Heterojuntion Diodes

GÜLLÜ H. H., BAYRAKLI Ö., COŞKUN E., PARLAK M.
32nd European Photovoltaic Solar Energy Conference and Exhibition, 20 - 24 Haziran 2016, (Özet Bildiri)

28. Characterization of CZTSe Thin Films for Solar Cell

BAYRAKLI Ö., GÜLLÜ H. H., TERLEMEZOĞLU M., PARLAK M., COŞKUN E.
32nd European Photovoltaic Solar Energy Conference and Exhibition, 20 - 24 Haziran 2016, (Özet Bildiri)

29. Effect of Nanowire Length on Device Performance of n ZnSe p Si Nanowire Heretojunctions

COŞKUN E., GÜLLÜ H. H., ÇOLAKOĞLU T., BAYRAKLI Ö., PARLAK M.
32nd European Photovoltaic Solar Energy Conference and Exhibition, 20 - 24 Haziran 2016, (Özet Bildiri)

30. Device characterization of Zn Sn Se ZTSe thin films for solar cell

BAYRAKLI Ö., GÜLLÜ H. H., COŞKUN E., PARLAK M.
European Materials Research Society 2016, 2 - 06 Mayıs 2016, (Özet Bildiri)

31. Effect of nanowire length on device performance of n In2Se3 p Si heterojuntions

COŞKUN E., ÇOLAKOĞLU T., GÜLLÜ H. H., BAYRAKLI Ö., PARLAK M.
European Materials Research Society 2016, 2 - 06 Mayıs 2016, (Özet Bildiri)

32. Studies on Device Properties of n ZnSe p Si Heterojuntion Diode

GÜLLÜ H. H., BAYRAKLI Ö., COŞKUN E., PARLAK M.
European Materials Research Society 2016, 2 - 06 Mayıs 2016, (Özet Bildiri)

33. Optical Behaviour of Sequantial Thermal Evaporation ZnInSe2 Thin Films

GÜLLÜ H. H., COŞKUN E., BAYRAKLI Ö., PARLAK M.
European Materials Research Society 2016, 2 - 06 Mayıs 2016, (Özet Bildiri)

34. Device characterization of Cu Ag Ga Te thin films for photovoltaic applications

COŞKUN E., GÜLLÜ H. H., PARLAK M.
Materials Research Society 2016, 28 Mart - 01 Nisan 2016, (Özet Bildiri) Sürdürülebilir Kalkınma

35. An Improved Method For The Determination Of Birefringence Dispersion Of Liquid Crystal Cell: A Simulation Study

ÖZCAN S., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.
9th International Physics Conference of the Balkan-Physical-Union (BPU), İstanbul, Türkiye, 24 - 27 Ağustos 2015, cilt.1722, (Tam Metin Bildiri) identifier identifier

36. Investigation of Electrical Properties of Cu Ag In Se Thin Films Deposited by Thermally Evaporation Method

GÜLLÜ H. H., COŞKUN E., BAYRAKLI Ö., PARLAK M., ERÇELEBİ A. Ç.
EU PVSEC 2015 31st European Photovoltaic Solar Energy Conference and Exhibition, 14 - 18 Eylül 2015

37. Fabrication and Characterization of p AgGaxIn1 xTe2 n ZnInSe2 Heterojunctions for Solar Cell Applications

BAYRAKLI Ö., GÜLLÜ H. H., COŞKUN E., PARLAK M.
2015 MRS Spring Meeting & Exhibit, 6 - 10 Nisan 2015

38. Material and Device Characterization of Cu0 5Ag0 5InSe2 and ZnInSe2 Thin Films for Photovoltaic Applications

GÜLLÜ H. H., COŞKUN E., BAYRAKLI Ö., PARLAK M.
2015 MRS Spring Meeting & Exhibit, 6 - 10 Nisan 2015, (Özet Bildiri) Sürdürülebilir Kalkınma

39. Investigation of optical parameters of thermally evaporated ZnSe thin films

Gullu H. H., COŞKUN E., Parlak M.
3rd Turkish Solar Electricity Conference and Exhibition (SolarTR), Ankara, Türkiye, 27 - 29 Nisan 2015, cilt.12, ss.1224-1228, (Tam Metin Bildiri) identifier identifier

40. Characterization of Sputtered Cu Zn Sn Te Thin Films for Device Applications

Hosseini A., GÜLLÜ H. H., COŞKUN E., TURAN R., ERÇELEBİ A. Ç.
E-MRS 2014, 03 Haziran 2014, (Tam Metin Bildiri)

41. Fabrication and Characterization of TiO2Thin Films for Device Applications

HOSSEINI A., GÜLLÜ H. H., COŞKUN E., TURAN R., ERÇELEBİ A. Ç.
E-MRS 2014, 20 - 22 Nisan 2014, (Tam Metin Bildiri)

42. PLAZMA DESTEKLİ KİMYASAL BUHAR BİRİKTİRME SİSTEMİ İLE BÜYÜTÜLEN HİDROJENLENMİŞ AMORF SİLİSYUM KARBÜR İNCE FİLMLERE RADYO FREKANSI GÜCÜ ETKİSİNİN X ISINI FOTOELEKTRON SPEKTROMETRESİ İLE İNCELENMESİ

GÜLLÜ H. H., COŞKUN E., PARLAK M.
MYOMAT 2009: I.ULUSAL METAL, YARIĐLETKEN veOKSĐT MATERYALLERĐN ÜRETĐMĐNDEKULLANILAN SĐSTEMLER ve ANALİZ TEKNİKLERİ KONGRESİ, Türkiye, 20 - 22 Nisan 2008, (Tam Metin Bildiri)

43. Profile Measurement of Objects by Using Stockwell and Continuous Wavelet Transforms

Kocahan O., COŞKUN E., ÖZDER S.
IEEE 16th Signal Processing and Communications Applications Conference, Aydın, Türkiye, 20 - 22 Nisan 2008, ss.804-807, (Tam Metin Bildiri) identifier identifier

44. S-transform analysis of projected fringe patterns - art. no. 66161A

Kocahan O., ÖZDER S., COŞKUN E.
Conference on Optical Measurement Systems for Industrial Inspection V, Munich, Almanya, 18 - 22 Haziran 2007, cilt.6616, (Tam Metin Bildiri) identifier identifier

45. Optical phase distribution evaluation by using S-transform

Kocallan O., ÖZDER S., COŞKUN E.
6th International Conference of the Balkan-Physical-Union, İstanbul, Türkiye, 22 - 26 Ağustos 2006, cilt.899, ss.684, (Tam Metin Bildiri) identifier identifier

46. The determination of birefringence dispersion in nematic liquid crystals by using the S-transform

COŞKUN E., Oezder S., Kocahan O., Koeysal O.
6th International Conference of the Balkan-Physical-Union, İstanbul, Türkiye, 22 - 26 Ağustos 2006, cilt.899, ss.439-440, (Tam Metin Bildiri) identifier identifier
Metrikler

Yayın

76

Yayın (WoS)

38

Yayın (Scopus)

37

Atıf (WoS)

208

H-İndeks (WoS)

8

Atıf (Scopus)

222

H-İndeks (Scopus)

8

Proje

7

Açık Erişim

2
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