Yayınlar & Eserler

Yayın Ağı

SCI, SSCI ve AHCI İndekslerine Giren Dergilerde Yayınlanan Makaleler

A new method to determine the continuous refractive index of an absorbing film by Generalized Stockwell Transform

COŞKUN E., Emir C., Selamet S., PARLAK M., ÖZDER S.
Optics and Laser Technology , cilt.167, 2023 (SCI-Expanded) identifier

An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

Tiryaki E., KOCAHAN YILMAZ Ö., ÖZDER S.
MEASUREMENT SCIENCE REVIEW , cilt.21, sa.2, ss.61-66, 2021 (SCI-Expanded) identifier identifier

Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform

ÖZCAN S., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.
THIN SOLID FILMS , cilt.692, 2019 (SCI-Expanded) identifier identifier

The zero order generalized Morse wavelet method to determine the refractive index and extinction coefficient dispersions of an absorbing film

KOCAHAN YILMAZ Ö., COŞKUN E., Tiryaki E., ÖZDER S.
THIN SOLID FILMS , cilt.673, ss.72-77, 2019 (SCI-Expanded) identifier identifier

Determination of phase from the ridge of CWT using generalized Morse wavelet

KOCAHAN YILMAZ Ö., Tiryaki E., COŞKUN E., ÖZDER S.
MEASUREMENT SCIENCE AND TECHNOLOGY , cilt.29, sa.3, 2018 (SCI-Expanded) identifier identifier

The generalized Morse wavelet method to determine refractive index dispersion of dielectric films

KOCAHAN YILMAZ Ö., ÖZCAN S., COŞKUN E., ÖZDER S.
MEASUREMENT SCIENCE AND TECHNOLOGY , cilt.28, sa.4, 2017 (SCI-Expanded) identifier identifier

Generalized Morse wavelet for the determination of the birefringence of a liquid crystal cell

KOCAHAN YILMAZ Ö., COŞKUN E., ÖZDER S.
MEASUREMENT SCIENCE AND TECHNOLOGY , cilt.26, sa.8, 2015 (SCI-Expanded) identifier identifier

Generalized Morse wavelets for the phase evaluation of projected fringe pattern

KOCAHAN YILMAZ Ö., COŞKUN E., ÖZDER S.
MEASUREMENT SCIENCE AND TECHNOLOGY , cilt.25, sa.10, 2014 (SCI-Expanded) identifier identifier

The Paul wavelet algorithm: an alternative approach to calculate the refractive index dispersion of a dielectric film from transmittance spectrum

COŞKUN E., ÖZDER S., Tiryaki E.
APPLIED PHYSICS B-LASERS AND OPTICS , cilt.113, sa.2, ss.243-250, 2013 (SCI-Expanded) identifier identifier

Influence of Annealing Temperature on the Electrical and Optical Properties of CdS Thin Films

ELMAS S., ÖZCAN S., ÖZDER S., BİLGİN V.
ACTA PHYSICA POLONICA A , cilt.121, sa.1, ss.56-58, 2012 (SCI-Expanded) identifier identifier

Paul wavelet algorithm for the determination of birefringence dispersion of a liquid crystal cell

COŞKUN E., ÖZDER S.
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS , cilt.28, sa.12, ss.2974-2978, 2011 (SCI-Expanded) identifier identifier

Determination of the refractive index of a dielectric film continuously by the generalized S-transform

COŞKUN E., SEL K., ÖZDER S.
OPTICS LETTERS , cilt.35, sa.6, ss.841-843, 2010 (SCI-Expanded) identifier identifier identifier

Refractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet transform method

COŞKUN E., SEL K., ÖZDER S., KURT M.
APPLIED OPTICS , cilt.47, sa.27, ss.4888-4894, 2008 (SCI-Expanded) identifier identifier identifier

Phase recovery from interference fringes by using S-transform

Dursun A., SARAÇ Z., Topkara M. S., ÖZDER S., ECEVİT F. N.
MEASUREMENT , cilt.41, sa.4, ss.403-411, 2008 (SCI-Expanded) identifier identifier

Determination of birefringence dispersion in nematic liquid crystals by using an S-transform

Ozder S., COŞKUN E., Koysal O., Kocahan O.
OPTICS LETTERS , cilt.32, sa.14, ss.2001-2003, 2007 (SCI-Expanded) identifier identifier identifier

The behavior of the strange quark matter in the FRW universes

YILMAZ İ., KÜÇÜKARSLAN A., ÖZDER S.
INTERNATIONAL JOURNAL OF MODERN PHYSICS A , cilt.22, sa.12, ss.2283-2291, 2007 (SCI-Expanded) identifier identifier

Effect of an azo dye (DR1) on the dielectric parameters of a nematic liquid crystal system

OZDER S., OKUTAN M., KOYSAL O., Goktas H., SAN S. E.
PHYSICA B-CONDENSED MATTER , cilt.390, ss.101-105, 2007 (SCI-Expanded) identifier identifier

Optical phase distribution evaluation by using an S-transform

Ozder S., KOCAHAN O., COŞKUN E., Goktas H.
OPTICS LETTERS , cilt.32, sa.6, ss.591-593, 2007 (SCI-Expanded) identifier identifier identifier

Molecular reorientation based diffraction in a hybrid liquid crystal system applicable for two different laser sources simultaneously

Koysal O., San S. E., Okutan M., Ozder S.
DYES AND PIGMENTS , cilt.73, sa.1, ss.65-68, 2007 (SCI-Expanded) identifier identifier

Diğer Dergilerde Yayınlanan Makaleler

Yaw Ve Pitch Kontrollü Dişli Kutusuz 5kW Rüzgâr Türbini Üretilmesi Ve Verimliliği

YÜCEL M., ÖZDER S.
Çanakkale Onsekiz mart Univ. Fen Bilimleri Enstitüsü dergisi , cilt.4, sa.1, ss.74-87, 2018 (Hakemli Dergi)

Hakemli Kongre / Sempozyum Bildiri Kitaplarında Yer Alan Yayınlar

CHEMICALLY SPRAYED SnO2:F (FTO) THIN FILMS FOR PHOTOVOLTAIC APPLICATIONS

KÜÇÜKARSLAN A., SARICA E., GÜNEŞ İ., AKYÜZ İ., ÖZDER S., BİLGİN V.
6nd International Conference on Material Science and Technology in Cappadocia (IMSTEC’21), Nevşehir/Kapadokya, Türkiye, 26 - 28 Kasım 2021

Ultrasonically spray deposited tin-doped indium oxide thin films for photovoltaic solar cell application

GÜNEŞ İ., SARICA E., AKYÜZ İ., KÜÇÜKARSLAN A., ÖZDER S., BİLGİN V.
Turkish Physical Society 37th International Physical Congress (TPS-37), Muğla, Türkiye, 1 - 05 Eylül 2021

Determination of surface profile of thin films by continuous wavelet transform.

TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E., ÖZDER S.
6. International Conference of Material Science and Nanotechnology for Next Generation (MSNG2019), Kayseri, Türkiye, 16 - 17 Ekim 2019

Electrical Properties of ZnSe/Si Nanowire and ZnSe/Si Heterostructures

BOZDOĞAN E., COŞKUN E., ÖZDER S., GÜLLÜ H. H., PARLAK M.
Turkish Physical Society 34th International Physics Congress (TFD-34), Muğla, Türkiye, 5 - 09 Eylül 2018

FOURIER TRANSFORM PHASE METHOD FOR THE DETERMINATION OF SURFACE MORPHOLOGY OF THIN FILM

KOCAHAN YILMAZ Ö., ERTÜRK E., ÖZDER S.
International Conference on Physical Chemistry and Functional Materials, Türkiye, 19 - 21 Haziran 2018

QUANTITATIVE PHASE IMAGING OF THIN FILM SURFACE BY DIFFRACTION PHASE MICROSCOPY

KOCAHAN YILMAZ Ö., ÖZDER S.
International Conference on Physical Chemistry and Functional Materials, 19 - 21 Haziran 2018

Substrate temperature effect on the structural, morphological, optical and electrical properties of spray-deposited zinc sulphide thin films

DEMİRSELÇUK B., BİLGİN V., SARICA E., ÖZDER S.
Turkish Physical Society 33rd International Physics Congress, 6 - 10 Eylül 2017

Effect of Zn/S molar ratio on the physical properties of spray-pyrolysed ZnS thin films for photovoltaic applications

DEMİRSELÇUK B., BİLGİN V., ÖZDER S., SARICA E.
Turkish Physical Society 33rd International Physics Congress, 6 - 10 Eylül 2017 Sürdürülebilir Kalkınma

Optical properties of slicon nanowires for different length fabricated by metal assisted chemical ethcing method

BOZDOĞAN E., COŞKUN E., ÖZDER S., KOCAHAN YILMAZ Ö.
Turkish Physical Society 33th International Physics Congress, 6 - 09 Eylül 2017

Production of silicon nanowire having different size by using metal assisted chemical etching method

BOZDOĞAN E., COŞKUN E., ÖZDER S., KOCAHAN YILMAZ Ö.
Turkish Physical Society 33th International Physics Congress, 6 - 09 Eylül 2017

The generalized morse wavelet to determine the refractive index and the extinction coefficient of an absorbing film from reflectance spectrum: a simulation study

TİRYAKİ E., KOCAHAN YILMAZ Ö., ÖZDER S.
Turkish Physical Society 33th International Physics Congress, 6 - 09 Eylül 2017

A simulation study to determine the birefringence dispersion of a liquid crystal from reflectance spectrum by using the paul wavelet

TİRYAKİ E., KOCAHAN YILMAZ Ö., ÖZDER S.
Turkish Physical Society 33th International Physics Congress, 6 - 09 Eylül 2017

A Simulation Study for Determination of Refractive Index Dispersion of Dielectric Film from Reflectance Spectrum by Using Paul Wavelet

Tiryaki E., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.
32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815 identifier identifier

Optical Phase Distribution Evaluation by Using Zero Order Generalized Morse Wavelet

KOCAHAN YILMAZ Ö., Elmas M. N., Durmus C., COŞKUN E., Tiryaki E., ÖZDER S.
32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815 identifier identifier

3D Profile Measurements of Objects by Using Zero Order Generalized Morse Wavelet

KOCAHAN YILMAZ Ö., Durmus C., Elmas M. N., COŞKUN E., Tiryaki E., ÖZDER S.
32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815 identifier identifier

Quantitative Phase Imaging of Red Blood Cell by Diffraction Phase Microscopy

KOCAHAN YILMAZ Ö., Tiryaki E., Durmus C., Elmas M. N., COŞKUN E., ÖZDER S.
International Workshop on Computing and Electromagnetics (CEM), Barcelona, İspanya, 21 - 24 Haziran 2017, ss.21-22 identifier

An Improved Method For Determination Of Refractive Index Of Absorbing Films: A Simulation Study

Özcan S., Coşkun E., Kocahan Yılmaz Ö., Özder S.
32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815 identifier identifier

An Improved Method For Simultaneous Determination Of Refractive Index And Thickness Of Dielectric Films A Simulation Study

ÖZCAN S., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.
Science and Applications of Thin Films, Congress & Exhibition - SATF 2016, İzmir, Türkiye, 19 - 23 Eylül 2016

Determination of the Refractive Index of Dielectric Films from the Transmittance Spectrum by Using Morse Wavelet

TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E., ELMAS M. N., ÖZDER S.
Science and Applications of Thin Films, Conference & Exhibition SATF 2016, 19 - 23 Eylül 2016

Theoretical Determination of the Refractive Index and Extinction Coefficient of an Absorbing Thin Film by Using Morse Wavelet

TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E., DURMUŞ Ç., ÖZDER S.
Science and Applications of Thin Films, Conference & Exhibition (SATF 2016), 19 - 23 Eylül 2016

A simulation study for determination of refractive index dispersion of dielectric film from reflectance spectrum by using Paul wavelet

TİRYAKİ E., COŞKUN E., ÖZDER S., BOZDOĞAN E., KOCAHAN YILMAZ Ö., ELMAS M. N.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016

An improved method for determination of refractive index of absorbing fılms a simulation study

ÖZCAN S., COŞKUN E., ÖZDER S., KOCAHAN YILMAZ Ö.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016

Optical phase distribution evaluation by using zero order generalized Morse wavelet

KOCAHAN YILMAZ Ö., ELMAS M. N., DURMUŞ Ç., COŞKUN E., TİRYAKİ E., ÖZDER S.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016

Determination of the refractive index dispersion of dielectric film from reflectance spectrum by using Morlet wavelet

TİRYAKİ E., COŞKUN E., ÖZDER S., KUŞ E., KOCAHAN YILMAZ Ö., DURMUŞ Ç.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016

3D profile measurements of objects by using zero order generalized Morse wavelet

KOCAHAN YILMAZ Ö., DURMUŞ Ç., ELMAS M. N., COŞKUN E., TİRYAKİ E., ÖZDER S.
Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016

Alternatif üstel tipli orbitaller hiperbolik kosinüs tiplifonksiyonlarının verimliliği

ERTÜRK M., ÖZDER S., Öztürk E.
ADIM FİZİK GÜNLERİ V, Eskişehir, Türkiye, 21 - 23 Nisan 2016

An Improved Method For The Determination Of Birefringence Dispersion Of Liquid Crystal Cell: A Simulation Study

ÖZCAN S., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.
9th International Physics Conference of the Balkan-Physical-Union (BPU), İstanbul, Türkiye, 24 - 27 Ağustos 2015, cilt.1722 identifier identifier

Profile Measurement of Objects by Using Stockwell and Continuous Wavelet Transforms

Kocahan O., COŞKUN E., ÖZDER S.
IEEE 16th Signal Processing and Communications Applications Conference, Aydın, Türkiye, 20 - 22 Nisan 2008, ss.804-807 identifier identifier

S-transform analysis of projected fringe patterns - art. no. 66161A

Kocahan O., ÖZDER S., COŞKUN E.
Conference on Optical Measurement Systems for Industrial Inspection V, Munich, Almanya, 18 - 22 Haziran 2007, cilt.6616 identifier identifier

Optical phase distribution evaluation by using S-transform

Kocallan O., ÖZDER S., COŞKUN E.
6th International Conference of the Balkan-Physical-Union, İstanbul, Türkiye, 22 - 26 Ağustos 2006, cilt.899, ss.684 identifier identifier

Metrikler

Yayın

61

Atıf (WoS)

115

H-İndeks (WoS)

6

Atıf (Scopus)

130

H-İndeks (Scopus)

6

Proje

6

Açık Erişim

2
BM Sürdürülebilir Kalkınma Amaçları